ONEIDA RESEARCH SERVICES INC -
NOT NADCAP Approved
90052053
Independent Processor
8811 AMERICAN WAY
ENGLEWOOD , CO 80112-7152 United States
Phone: 315-736-5480
Fax: 315-736-9321
90052053
Independent Processor
8811 AMERICAN WAY
ENGLEWOOD , CO 80112-7152 United States
Phone: 315-736-5480
Fax: 315-736-9321
Selected sector: SP-SSSD
Specification
ProcessDescription
Category
DESTRUCTIVE PHYSICAL ANALYSIS (DPA), REQUIREMENTS FOR
Miscellaneous
Limits:
None
Destructive Physical Analysis (DPA), Requirements for Capacitors
Limits:
None
DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
REQUIREMENTS FOR:
CONNECTORS AND CONTACTS
Space
Limits:
None
DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
REQUIREMENTS FOR:
MISCELLANEOUS RF DEVICES
Space
Limits:
None
Destructive Physical Analysis (DPA), Requirements for Filters
Limits:
None
Destructive Physical Analysis (DPA), Requirements for Magnetic Devices
Limits:
None
Destructive Physical Analysis (DPA), Requirements for Fuses
Limits:
None
Destructive Physical Analysis (DPA), Requirements for Heaters
Limits:
None
Destructive Physical Analysis (DPA), Requirements for Isolators and Circulators
Limits:
None
Destructive Physical Analysis (DPA), Requirements for Power Dividers, Couplers, Mixers, & Similar RF Devices
Limits:
None
Destructive Physical Analysis (DPA), Requirements for Resistors
Limits:
None
DESTRUCTIVE PHYSICAL ANALYSIS (DPA) FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL
Materials Testing
Limits:
None
Leak Test
Limits:
MIL-STD-202, Method 112E, test conditions C procedures I, IIIa-c, IV, D, and E (Restricted to pre-inspection for destructive part analysis only).
TEST METHODS FOR SEMICONDUCTOR DEVICES
Materials Testing
Limits:
Method 1018.6
Test Method Standard Microcircuits
Materials Testing
Limits:
Method 1018.10