Eurofins EAG Materials Science LLC - NOT NADCAP Approved
90123816
Independent Processor
250 North Nash St
EL SEGUNDO , CA 90245 United States
Phone: 310-322-2011
Fax:
Selected sector: SP-SSSD
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Specification
ProcessDescription
Category
M273876/01
Destructive Physical Analysis (DPA), Requirements for Diodes
Limits:
None
M273876/02
Destructive Physical Analysis (DPA), Requirements for Transistors
Limits:
None
M273876/03
Destructive Physical Analysis (DPA), Requirements for Microcircuits
Limits:
None
M273876/04
Destructive Physical Analysis (DPA), Requirements for Hybrids
Limits:
None
M273876/05
Destructive Physical Analysis (DPA), Requirements for Chip Diodes, Transistors & Integrated Circuits
Limits:
None
M273876/06
Destructive Physical Analysis (DPA), Requirements for Capacitors
Limits:
None
M273876/08
DESTRUCTIVE PHYSICAL ANALYSIS (DPA) REQUIREMENTS FOR: MISCELLANEOUS RF DEVICES
Space
Limits:
None
M273876/09
Destructive Physical Analysis (DPA), Requirements for Filters
Limits:
None
M273876/10
Destructive Physical Analysis (DPA), Requirements for Magnetic Devices
Limits:
None
M273876/11
Destructive Physical Analysis (DPA), Requirements for Fuses
Limits:
None
M273876/12
Destructive Physical Analysis (DPA), Requirements for Heaters
Limits:
None
M273876/13
Destructive Physical Analysis (DPA), Requirements for Isolators and Circulators
Limits:
None
M273876/14
Destructive Physical Analysis (DPA), Requirements for Power Dividers, Couplers, Mixers, & Similar RF Devices
Limits:
None
M273876/15
Destructive Physical Analysis (DPA), Requirements for Rectifier Assemblies
Limits:
None
M273876/16
Destructive Physical Analysis (DPA), Requirements for Relays
Limits:
None
M273876/17
Destructive Physical Analysis (DPA), Requirements for Resistors
Limits:
None
M273876/18
Destructive Physical Analysis (DPA), Requirements for Switches
Limits:
None
M273876/19
Destructive Physical Analysis (DPA), Requirements for Tuning Screws and Tuning Elements
Limits:
None
M273876/20
Destructive Physical Analysis (DPA), Requirements for Quartz Crystal Units, Monolithic Crystal Filters and Hybrid Type Crystal Oscillators
Limits:
None
MIL-STD-750 (Method 1071)
Hermetic Seal Leak Test for Semiconductor Devices
Limits:
None