Specification | ProcessDescription | Category | SpecLimits |
MIL-STD-750 | TEST METHODS FOR SEMICONDUCTOR DEVICES | Materials Testing | Limits: Limited to Digital X-ray – Method 2076.5 |
TS19-03/02 | RADIOGRAPHIC INSPECTION CRITERIA TRANSISTORS, DETAIL SPECIFICATION SHEET | Space | Limits: Limited to Accept/Reject criteria only. |
TS19-03/04 | RADIOGRAPHIC INSPECTION CRITERIA DIODES DETAIL SPECIFICATION SHEET | Space | Limits: Limited to Accept/Reject criteria only. |