| Specification | ProcessDescription | Category | SpecLimits |
| ASTM E1742 | Standard Practice for Radiographic Examination | Non-Destructive Testing | Limits: None |
| MIL-STD-202 (Method 209) | Radiographic Inspection of Electronic Components | Limits: Limits: Film Radiography | |
| MIL-STD-750 (Method 2076) | Radiographic Inspection of Electronic Components | Limits: Limits: Film Radiography | |
| MIL-STD-883 (Method 2012) | Radiographic Inspection of Electronic Components | Limits: Limits: Film Radiography | |
| TS19-03 | Radiographic Inspection of Electronic Components | Space | Limits: Limits: Film Radiography |
| TS19-03/03 | RADIOGRAPHIC INSPECTION CRITERIA CAPACITORS, DETAIL SPECIFICATION SHEET | Space | Limits: None |
| TS19-03/06 | RADIOGRAPHIC INSPECTION CRITERIA FOR MAGNETIC DEVICES, DETAIL SPECIFICATION SHEET | Space | Limits: None |
| TS19-03/09 | Radiographic Inspection Criteria, RF Devices, Passive, Detail Specification Sheet | Space | Limits: None |