| Specification | Process Description | Category | Limits |
| ASTM E1742 | Standard Practice for Radiographic Examination | Non-Destructive Testing | Limits: Film Radiography only |
| LMA-PC201 | Fluorescent Penetrant Inspection of Metallic Parts & Materials | Non-Destructive Testing | Limits: Excludes Fracture Critical parts Method A only, no cleaning or etching approved |
| LMA-PC301 | Radiographic Inspection | Non-Destructive Testing | Limits: Limited to film based radiography only |
| MIL-STD-750-2 | Test Methods for Semiconductor Devices | Non-Destructive Testing | Limits: Method 2076.4, Radiographic Inspection, Film Techniques only |
| MIL-STD-883 | Test Method Standard Microcircuits | Materials Testing | Limits: Method 2012.10 Radiography, Film Techniques Only |