| Specification | ProcessDescription | Category | SpecLimits |
| MIL-STD-750 | TEST METHODS FOR SEMICONDUCTOR DEVICES | Materials Testing | Limits: Method 1071.18 Test conditions A,B, G1, and G2. Test condition GT |
| MIL-STD-883 | Test Method Standard Microcircuits | Materials Testing | Limits: Method 1014.19 Test conditions B1,B2, and B3. Test condition G1 |