| Specification | ProcessDescription | Category | SpecLimits |
| MIL-STD-750 (Method 1071) | Hermetic Seal Leak Test for Semiconductor Devices | Limits: Method 1071.16 test conditions A, B, G1 and G2 | |
| MIL-STD-883 | Test Method Standard Microcircuits | Materials Testing | Limits: Method 1014.17 test conditions B1, B2 and B3. Special handling instructions per MPETL.PMP.23-060 are required for ESD sensitive items. |