| Specification | ProcessDescription | Category | SpecLimits |
| MIL-STD-750 (Method 2076) | Radiographic Inspection of Electronic Components | Limits: Limited to Digital X-ray | |
| MIL-STD-883 (Method 2012) | Radiographic Inspection of Electronic Components | Limits: Limited to Digital X-ray | |
| TS19-03 | Radiographic Inspection of Electronic Components | Space | Limits: Limited to: Digital Radioscopy |
| TS19-03/02 | RADIOGRAPHIC INSPECTION CRITERIA TRANSISTORS, DETAIL SPECIFICATION SHEET | Space | Limits: None |
| TS19-03/05 | RADIOGRAPHIC INSPECTION CRITERIA MONOLITHIC AND HYBRID MICROCIRCUTES, DETAIL SPECIFICATION SHEET | Space | Limits: None |