| M273876/22 | Destructive Physical Analysis (DPA), Requirements for Microcircuits/Hybrids, MMIC, GaAs | |
| Superseded by: None | Superseded By: None | |
| Selected sector: SP-SSSD | Date added: | |
| SupplierNumber | SupplierName | State | CountryName |
| 90124279 | ONEIDA RESEARCH SERVICES INC | NY | United States |